經(jīng)銷品牌
你的位置：首頁 » 產(chǎn)品中心 » Former(二手)儀器 » 網(wǎng)絡(luò)分析儀 » E5071C-480 4-port Test Set, 9 kHz to 8.5 GHz without Bias Tees---聯(lián)系電話18912657535
儀器名稱: E5071C-480 4-port Test Set, 9 kHz to 8.5 GHz without Bias Tees---聯(lián)系電話18912657535 儀器型號: E5071C-480-TDR-010 儀器品牌: Agilent 儀器指標: 4-port ,9 kHz to 8.5 GHz
- Wide dynamic range: > 123 dB dynamic range at test port (typical)
- Fast measurement speed: 41 ms @ full 2-port cal, 1601 points
- Low trace noise: 0.004 dB rms @ 70 kHz IFBW
- Integrated S-parameter test set
- Port options: 2-port and 4-port
- Balanced measurements (4-port option)
- Frequency options: From 9 kHz - 8.5 GHz
E5071C-TDR Enhanced Time Domain Analysis
The E5071C network analyzer offers the highest RF performance and fastest speed in its class, with a wide frequency range and versatile functions. The E5071C is the ideal solution for manufacturing and R&D engineers evaluating RF components and circuits for frequency range up to 20 GHz.
What's New: The new 6.5 and 14 GHz options expand the E5071C's frequency range beyond the existing 4.5, 8.5 and 20 GHz line-up, allowing users to select the most suitable frequency option for their specific application and significantly reducing the production line's cost of test. Both the 6.5 and 14 GHz options support 2- and 4-port configurations. Such flexibility is ideal for component manufacturers, wireless designers and aerospace/defense contractors performing RF component test.
Description
The E5071C-TDR is application software embedded in the ENA network analyzer that provides a one-box solution for high-speed serial interconnect analysis. For signal integrity design and verification, it brings three breakthroughs; simple and intuitive operation, fast and accurate measurements, and ESD robustness.
E5071C-TDR Enhanced Time Domain Analysis
Key Features & Specifications
- Real time measurements simultaneously in time domain (TDR/TDT) and frequency domain (S-parameters)
- Simple operations with intuitive user interface
- Eye diagram tests without external bit pattern generator
- Excellent ESD Robustness for reduction of maintenance cost
- Stressed eye diagram analysis of interconnects with emphasis, equalization and jitter insertion features
- Impedance analysis of active devices under actual operating conditions with Hot TDR measurement capability
- Method of Implementation (MOI) for High Speed Digital Applications are available: USB, HDMI, SATA, DisplayPort, MIPI and more